General acquisition covering materials science and other use cases. For specialized techniques, use the appropriate subclass (AcquisitionSpa for single particle, or tomography subclasses).
Time of data acquisition per movie/tilt - in s
The total electron beam current hitting the viewing screen, in nA.
Specifies which Acquisition subschema/class is in use.
Average dose per image/movie/tilt - given in electrons per square Angstrom
Level of binning on the images applied during data collection
Temperature during data collection, in K with min and max values.
Whether and how you have to flip or rotate the gainref in order to align with your acquired images
Type of cryogen used in the holder - if the holder is cooled seperately
Machine estimated defocus, min and max values in µm. Has a tendency to be off.
Whether an energy filter was used and its specifics.
The size of the image in pixels, height and width given.
Number of grids imaged for this project - here with qualifier during this data acquisition
Any type of special optics, such as a phaseplate
Number of images generated total for this data collection - might need a qualifier for tilt series to determine whether full series or individual tilts are counted
Cryogen used in cooling the instrument and sample, usually nitrogen
Movement of the beam above the sample for data collection purposes that does not require movement of the stage. Given in mrad.
Another way to move the beam above the sample for data collection purposes that does not require movement of the stage. Given in mrad.
Target defocus set, min and max values in nm.
Number of Beamtilt groups present in this dataset - for optimized processing split dataset into groups of same tilt angle. Despite its name Beamshift is often used to achive this result.
Number of frames that on average constitute a full movie, can be a bit hard to define for some detectors
Movement of the Beam below the image in order to shift the image on the detector. Given in µm.
Magnification level as indicated by the instrument, no unit
List of custom descriptors for user-defined key-value pairs describing how micrographs were obtained or any related information
A series of numbers constructed from min, max, and increment
Minimal value of a given dataset property
Maximal value of a given dataset property
cryo electron tomography dataset, with a focus on a single protein (complex) & subtomogram averaging
Describe the data acquisition parameters
Describe the instrument used to acquire the data
Unifying class to describe the full sample.
List of ligands associated with the sample
List of molecule associated with the sample
The tilt axis angle of a tomography series
The min, max and increment of the tilt angle in a tomography session. Unit is degree.
if a value has a unit, it should be given as a unit value pair.
Special device used to correct instrument inherent chromatic aberration.
whether a specific instrument was used during data acquisition
Details of a given specialist instrument
Used to modulate the phase of the electron wave.
Special device used to correct instrument inherent spherical aberration.
Instrument values, mostly constant across a data collection.
C2 aperture size used in data acquisition, in µm
Refers to how tightly or widely the electron beam is focused onto the sample, in mrad. Typically low convergence for TEM and high for STEM.
Spherical aberration of the instrument, in mm
Type of electron source used in the microscope, such as FEG
Operating mode of the microscope, i.e. "TEM", "STEM"
Mode of imaging used during data collection
Voltage used for the electron acceleration, in kV
Mode of illumination used during data collection
Details on the person performing the experiment.
Type of organization, academic, commercial, governmental, etc.
Role of the author, for example principal investigator
ORCID of the author, a type of unique identifier
Overarching category for authors and grants
List of authors associated with the project
List of grants associated with the project
Details on the grid used in the experiment.
Pressure of the chamber during pretreatment, in Pa
Type of pretreatment of the grid, i.e., glow discharge
Atmospheric conditions in the chamber during pretreatment, i.e., addition of specific gases, etc.
Type of material the support film is made of
Provide a valid SMILES string of your ligand
Link to a reference of your ligand, i.e., CCD, PubChem, etc.
More detailed information about individual molecules.
Full sequence of the sample as in the data, i.e., cleaved tags should also be removed from sequence here
Description of the overall molecular type, i.e., a complex
Name of an individual molecule (often protein) in the sample
Taxonomy ID of the natural source organism
Scientific name of the natural host organism
Scientific name of the organism used to produce the molecule of interest
Taxonomy ID of the expression system organism
What type of higher order structure your sample forms - if any.
Where the sample was taken from, i.e., natural host, recombinantly expressed, etc.
Environmental humidity just before vitrification, in %
Which cryogen was used for vitrification
Name/composition of the (chemical) sample buffer during grid preparation
Environmental temperature just before vitrification, in K
Concentration of the (supra)molecule in the sample, in mg/ml
Any type, used as the base for type-narrowing.
Dispersion of an analytical detector, in eV
Collection angle set, min and max values in mrad.
Mode of the detector, e.g. "counting", "ScanningDetector", "ImagingDetector", etc.
A device used to filter for electrons with specific energy.
Optional optics used to correct for instrument limitations.
Specialist device to correct for spherical aberration of the microscope lenses
Phaseplate is a special optics device that can be used to enhance contrast
Specialist device to correct for chromatic aberration of the microscope lenses
The width of a given item - unit depends on item
The height of a given item - unit depends on item
an axis-aligned 2D bounding box (float units)
unit value extended to have two additional fields si_value and si_unit
value of a given field in respect to its SI unit