The size of the image in pixels, height and width given.
Any type of special optics, such as a phaseplate
Number of images generated total for this data collection - might need a qualifier for tilt series to determine whether full series or individual tilts are counted
Temperature during data collection, in K with min and max values.
Machine estimated defocus, min and max values in µm. Has a tendency to be off.
Number of frames that on average constitute a full movie, can be a bit hard to define for some detectors
Whether and how you have to flip or rotate the gainref in order to align with your acquired images
The total electron beam current hitting the viewing screen, in nA.
Time of data acquisition per movie/tilt - in s
Movement of the Beam below the image in order to shift the image on the detector. Given in µm.
Target defocus set, min and max values in nm.
Cryogen used in cooling the instrument and sample, usually nitrogen
Another way to move the beam above the sample for data collection purposes that does not require movement of the stage. Given in mrad.
Number of grids imaged for this project - here with qualifier during this data acquisition
Movement of the beam above the sample for data collection purposes that does not require movement of the stage. Given in mrad.
Type of cryogen used in the holder - if the holder is cooled seperately
Level of binning on the images applied during data collection
Whether an energy filter was used and its specifics.
Number of Beamtilt groups present in this dataset - for optimized processing split dataset into groups of same tilt angle. Despite its name Beamshift is often used to achive this result.
Average dose per image/movie/tilt - given in electrons per square Angstrom
Magnification level as indicated by the instrument, no unit
cryo electron tomography dataset, with a focus on a single protein (complex) & subtomogram averaging
Describe the instrument used to acquire the data
Describe the data acquisition parameters
The tilt axis angle of a tomography series
The min, max and increment of the tilt angle in a tomography session. Unit is degree.
Special device used to correct instrument inherent chromatic aberration.
Details of a given specialist instrument
whether a specific instrument was used during data acquisition
Used to modulate the phase of the electron wave.
Special device used to correct instrument inherent spherical aberration.
List of custom descriptors for user-defined key-value pairs describing how micrographs were obtained or any related information
A series of numbers constructed from min, max, and increment
Maximal value of a given dataset property
Minimal value of a given dataset property
Instrument values, mostly constant across a data collection.
Mode of imaging used during data collection
C2 aperture size used in data acquisition, in µm
Operating mode of the microscope, i.e. "TEM", "STEM"
Voltage used for the electron acceleration, in kV
Spherical aberration of the instrument, in mm
Refers to how tightly or widely the electron beam is focused onto the sample, in mrad. Typically low convergence for TEM and high for STEM.
Mode of illumination used during data collection
Type of electron source used in the microscope, such as FEG
Details on the person performing the experiment.
Type of organization, academic, commercial, governmental, etc.
Role of the author, for example principal investigator
ORCID of the author, a type of unique identifier
Overarching category for authors and grants
List of authors associated with the project
List of grants associated with the project
Unifying class to describe the full sample.
List of ligands associated with the sample
List of molecule associated with the sample
if a value has a unit, it should be given as a unit value pair.
General acquisition covering materials science and other use cases. For specialized techniques, use the appropriate subclass (AcquisitionSpa for single particle, or tomography subclasses).
Specifies which Acquisition subschema/class is in use.
Details on the grid used in the experiment.
Type of pretreatment of the grid, i.e., glow discharge
Atmospheric conditions in the chamber during pretreatment, i.e., addition of specific gases, etc.
Pressure of the chamber during pretreatment, in Pa
Type of material the support film is made of
Link to a reference of your ligand, i.e., CCD, PubChem, etc.
Provide a valid SMILES string of your ligand
More detailed information about individual molecules.
Scientific name of the natural host organism
Full sequence of the sample as in the data, i.e., cleaved tags should also be removed from sequence here
Name of an individual molecule (often protein) in the sample
Description of the overall molecular type, i.e., a complex
Taxonomy ID of the expression system organism
Taxonomy ID of the natural source organism
Scientific name of the organism used to produce the molecule of interest
Where the sample was taken from, i.e., natural host, recombinantly expressed, etc.
What type of higher order structure your sample forms - if any.
Environmental humidity just before vitrification, in %
Which cryogen was used for vitrification
Environmental temperature just before vitrification, in K
Name/composition of the (chemical) sample buffer during grid preparation
Concentration of the (supra)molecule in the sample, in mg/ml
Any type, used as the base for type-narrowing.
Mode of the detector, e.g. "counting", "ScanningDetector", "ImagingDetector", etc.
Collection angle set, min and max values in mrad.
Dispersion of an analytical detector, in eV
A device used to filter for electrons with specific energy.
Optional optics used to correct for instrument limitations.
Phaseplate is a special optics device that can be used to enhance contrast
Specialist device to correct for spherical aberration of the microscope lenses
Specialist device to correct for chromatic aberration of the microscope lenses
The width of a given item - unit depends on item
The height of a given item - unit depends on item
an axis-aligned 2D bounding box (float units)
unit value extended to have two additional fields si_value and si_unit
value of a given field in respect to its SI unit